{"id":5020,"date":"2022-12-28T19:48:20","date_gmt":"2022-12-28T18:48:20","guid":{"rendered":"https:\/\/martin.elvers.website\/?p=5020"},"modified":"2022-12-28T19:48:22","modified_gmt":"2022-12-28T18:48:22","slug":"pl-mapper","status":"publish","type":"post","link":"https:\/\/martin.elvers.website\/en\/pl-mapper\/","title":{"rendered":"PL mapper"},"content":{"rendered":"<h3 class=\"wp-block-heading\">Characterization of thin film solar cells<\/h3>\n\n\n\n<p class=\"wp-block-paragraph\">Together with the IRDEP (Insitute of Research and Development on Photovoltaic Energy), the company Photon etc has developed a PL mapper for the characterization of thin-film solar cells.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Photoluminescence methods are often used to detect defects in a layer system such as LEDs, OFETs or solar cells at an early stage. In these weak processes, the\u00a0<strong>Hyperspectral Imager<\/strong>\u00a0increase efficiency and throughput due to its high transmission of up to 80% and detect defects with a spectral resolution of up to 0.3 nm. The location and size of the defect is displayed directly on the array camera using imaging optics. An xy scanning device, as required by a classic spectrometer, is not required with this design. In addition to photoluminescence, electroluminescence and diffuse reflection can also be measured with the same equipment. Whether you want to examine entire cells or just tiny areas, the Hyperspectral Imager can be designed for both macroscopic and microscopic applications.<\/p>\n\n\n\n<figure class=\"wp-block-image size-full\"><a href=\"https:\/\/martin.elvers.website\/wp-content\/uploads\/2022\/12\/pl-mapper-1.png\"><img loading=\"lazy\" decoding=\"async\" width=\"600\" height=\"302\" src=\"https:\/\/martin.elvers.website\/wp-content\/uploads\/2022\/12\/pl-mapper-1.png\" alt=\"\" class=\"wp-image-5021\" srcset=\"https:\/\/martin.elvers.website\/wp-content\/uploads\/2022\/12\/pl-mapper-1.png 600w, https:\/\/martin.elvers.website\/wp-content\/uploads\/2022\/12\/pl-mapper-1-300x151.png 300w\" sizes=\"auto, (max-width: 600px) 100vw, 600px\" \/><\/a><\/figure>","protected":false},"excerpt":{"rendered":"<p>Characterization of thin-film solar cells Together with the IRDEP (Insitute of Research and Development on Photovoltaic Energy), Photon etc. has developed a PL mapper for the characterization of thin-film solar cells. Photoluminescence methods are often used to detect defects in a layer system such as LEDs, OFETs or solar cells at an early stage. With these weak processes, the Hyperspectral Imager can increase the efficiency or throughput ...<\/p>\n<p class=\"read-more\"> <a class=\"\" href=\"https:\/\/martin.elvers.website\/en\/pl-mapper\/\"> <span class=\"screen-reader-text\">PL mapper<\/span> ReadMore \u00bb<\/a><\/p>","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_uag_custom_page_level_css":"","site-sidebar-layout":"default","site-content-layout":"default","ast-global-header-display":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","footnotes":""},"categories":[172],"tags":[],"class_list":["post-5020","post","type-post","status-publish","format-standard","hentry","category-blog"],"uagb_featured_image_src":{"full":false,"thumbnail":false,"medium":false,"medium_large":false,"large":false,"1536x1536":false,"2048x2048":false,"trp-custom-language-flag":false,"woocommerce_thumbnail":false,"woocommerce_single":false,"woocommerce_gallery_thumbnail":false},"uagb_author_info":{"display_name":"admin","author_link":"https:\/\/martin.elvers.website\/en\/author\/gereon\/"},"uagb_comment_info":0,"uagb_excerpt":"Charakterisierung von D\u00fcnnfilmsolarzellen Zusammen mit dem IRDEP (Insitute of Research and Development on Photovoltaic Energy) hat die Firma Photon etc einen PL- Mapper entwickelt zur Charakterisierung von D\u00fcnnfilmsolarzellen. Um Fehlstellen in einem Schichtsystem wie\u00a0zum Beispiel bei\u00a0LEDs, OFETs oder\u00a0Solarzellen fr\u00fchzeitig zu erkennen, werdem h\u00e4ufig Photolumineszenzverfahren angewandt. Bei diesen lichtschwachen Prozessen kann der\u00a0Hyperspectral Imager\u00a0die Effizenz bzw. Durchsatz&hellip;","_links":{"self":[{"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/posts\/5020","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/comments?post=5020"}],"version-history":[{"count":1,"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/posts\/5020\/revisions"}],"predecessor-version":[{"id":5022,"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/posts\/5020\/revisions\/5022"}],"wp:attachment":[{"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/media?parent=5020"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/categories?post=5020"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/martin.elvers.website\/en\/wp-json\/wp\/v2\/tags?post=5020"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}