PL mapper

Characterization of thin film solar cells

Together with the IRDEP (Insitute of Research and Development on Photovoltaic Energy), the company Photon etc has developed a PL mapper for the characterization of thin-film solar cells.

Photoluminescence methods are often used to detect defects in a layer system such as LEDs, OFETs or solar cells at an early stage. In these weak processes, the Hyperspectral Imager increase efficiency and throughput due to its high transmission of up to 80% and detect defects with a spectral resolution of up to 0.3 nm. The location and size of the defect is displayed directly on the array camera using imaging optics. An xy scanning device, as required by a classic spectrometer, is not required with this design. In addition to photoluminescence, electroluminescence and diffuse reflection can also be measured with the same equipment. Whether you want to examine entire cells or just tiny areas, the Hyperspectral Imager can be designed for both macroscopic and microscopic applications.